Mixer Reliability

Abstract

This chapter talks about millimeter-wave mixer reliability subjected to electrical stress. Transistor stress data in additional to mixer performance before and after stress are provided.

Publication Date

1-1-2016

Publication Title

SpringerBriefs in Applied Sciences and Technology

Issue

9789811008825

Number of Pages

49-53

Document Type

Article; Book Chapter

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/978-981-10-0884-9_6

Socpus ID

85027703337 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85027703337

This document is currently not available here.

Share

COinS