Title
Mixer Reliability
Abstract
This chapter talks about millimeter-wave mixer reliability subjected to electrical stress. Transistor stress data in additional to mixer performance before and after stress are provided.
Publication Date
1-1-2016
Publication Title
SpringerBriefs in Applied Sciences and Technology
Issue
9789811008825
Number of Pages
49-53
Document Type
Article; Book Chapter
Personal Identifier
scopus
DOI Link
https://doi.org/10.1007/978-981-10-0884-9_6
Copyright Status
Unknown
Socpus ID
85027703337 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85027703337
STARS Citation
Yuan, Jiann Shiun, "Mixer Reliability" (2016). Scopus Export 2015-2019. 3872.
https://stars.library.ucf.edu/scopus2015/3872
COinS