Oscillator Design For Variability

Abstract

This chapter discusses the impact of process variation on the voltage-controlled oscillator performance degradation. Mixed-mode device and circuit simulation is used to probe the physical insight. Analytical equations are dervied to provide the theoretical basis. Monte Carlo simulation results are shown to demonstrate the statistical variation of VCO performance subjected to process variation. Substrate bias technique helps reduce the process variation effect on VCO performance fluctuation.

Publication Date

1-1-2016

Publication Title

SpringerBriefs in Applied Sciences and Technology

Issue

9789811008825

Number of Pages

89-97

Document Type

Article; Book Chapter

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/978-981-10-0884-9_9

Socpus ID

85027703193 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85027703193

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