Title
Dependence Of Solar Cell Contact Resistivity Measurements On Sample Preparation Methods
Abstract
The measurement of contact resistivity between the grid metallization of a solar cell and the underlying silicon wafer is most conveniently performed by cutting strips from solar cells rather than fabricating dedicated structures with variable spaced contacts. We studied the effect of strip width on the measurements and found the lowest values in the range of 10-15 mm. We found laser scribing conditions whereby strips could be successfully isolated on the emitter side without snapping strips from the rest of the cell.
Publication Date
11-18-2016
Publication Title
Conference Record of the IEEE Photovoltaic Specialists Conference
Volume
2016-November
Number of Pages
3033-3036
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/PVSC.2016.7750221
Copyright Status
Unknown
Socpus ID
85003604090 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85003604090
STARS Citation
Gabor, Andrew M.; Gregory, Geoffrey; Payne, Adam M.; Janoch, Rob; and Anselmo, Andrew, "Dependence Of Solar Cell Contact Resistivity Measurements On Sample Preparation Methods" (2016). Scopus Export 2015-2019. 4374.
https://stars.library.ucf.edu/scopus2015/4374