Observation Of Interface Dynamics And Cu Island Formation At A Crystalline Si/Liquid Al-Alloy Interface

Keywords

Aluminum alloys; In-situ transmission electron microscopy (TEM); Interface segregation; Nucleation; Solid/liquid interface

Abstract

This research was performed to quantify the atomic-level dynamic behavior and the nature of Cu segregation to a crystalline Si/liquid Al-alloy interface in a partially molten Al-Si-Cu-Mg alloy. The results show that in contrast to atomistic simulations, no characteristic fluctuations were observed at a {113} Si/liquid Al-alloy interface other than a tendency to advance/recede by one or two {113} interplanar spacings. Segregation of Cu to the interface was found to occur by the formation of nano-scale fluctuating Cu islands, which had a highly reproducible orientation relationship with the crystalline Si. The fluctuating Cu islands had an approximately Gaussian distribution of heights while the widths displayed a log-normal distribution, indicative of high interfacial mobility and coalescence among islands. The presence of Cu islands was found to suppress the dynamic motion of the {113} Si solid-liquid interface. These findings reveal new and unexpected behavior about both the dynamic behavior of, and possible segregation mechanisms to, solid-liquid interfaces.

Publication Date

7-1-2017

Publication Title

Acta Materialia

Volume

133

Number of Pages

224-229

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1016/j.actamat.2017.05.023

Socpus ID

85019843147 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85019843147

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