Optical Loss Analysis Of Silicon Solar Cells Using Spatial Resolved Quantum Efficiency And Reflectance Measurements

Abstract

IQE data has long been a key analysis tool for c-Si cell research. Transitioning from single point measurements to spatially resolved measurements allows for the detailed analysis of quality and uniformity of the processes and materials used in cell manufacturing. This work explores how spatially resolved reflectance data can be analyzed to provide valuable information regarding the front surface texturing, rear surface properties, and ARC properties of completed solar cells.

Publication Date

1-1-2017

Publication Title

2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Number of Pages

2385-2387

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2017.8366583

Socpus ID

85048482796 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85048482796

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