Loss Reduction Of Silicon-On-Insulator Waveguides For Deep Mid-Infrared Applications
Abstract
We report that propagation loss of optical waveguides based on a silicon-on-insulator (SOI) material platform can be greatly reduced. Our simulations show that the loss, including SiO2 absorption and substrate leakage, but no scattering loss, is 0.024 and 0.53 dB/cm in the deep mid-infrared at 4.8 and 7.1 μm wavelengths, where the material absorption in SiO2 is 100 and 1000 dB/cm, respectively. The loss becomes negligible, compared to scattering loss in Si waveguides. This is enabled by using the TE10 mode in a pedestal waveguide. We also show that the TE10 mode can be excited in the proposed waveguide by the fundamental mode with a coupling efficiency of >94%. Low propagation loss, high coupling efficiency, and fabrication-friendly design would make it promising for practical use of SOI devices in the deep mid-infrared.
Publication Date
9-1-2017
Publication Title
Optics Letters
Volume
42
Issue
17
Number of Pages
3454-3457
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/OL.42.003454
Copyright Status
Unknown
Socpus ID
85028626130 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85028626130
STARS Citation
He, Liuqing; Guo, Yuhao; Han, Zhaohong; Wada, Kazumi; and Kimerling, Lionel C., "Loss Reduction Of Silicon-On-Insulator Waveguides For Deep Mid-Infrared Applications" (2017). Scopus Export 2015-2019. 5750.
https://stars.library.ucf.edu/scopus2015/5750