Embedded Shunt Diode Pair To Suppress Overshoot Voltage
Keywords
Electrostatic Discharge (ESD); Silicon Controlled Rectifier (SCR); Voltage overshoot elimination
Abstract
An EMC (electromagnetic compatibility) bidirectional blocking voltage protection clamp is introduced. This device addresses shortcomings in existing solutions for interface applications with narrow design window. To suppress the voltage overshoot during transient stress conditions, embedded avalanche diodes accelerate the transition of the clamp to the on-state. By embedding the avalanche-driven triggering mechanism, this device provides a fast turn-on speed without compromising its high current handling capability. The device physics insight is demonstrated via electro-Thermal numerical simulations.
Publication Date
5-30-2017
Publication Title
IEEE International Reliability Physics Symposium Proceedings
Number of Pages
EL4.1-EL4.4
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/IRPS.2017.7936370
Copyright Status
Unknown
Socpus ID
85024392044 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85024392044
STARS Citation
He, Linfeng; Salcedo, Javier A.; Parthasarathy, Srivatsan; Zhou, Paul; and Dong, Aihua, "Embedded Shunt Diode Pair To Suppress Overshoot Voltage" (2017). Scopus Export 2015-2019. 7550.
https://stars.library.ucf.edu/scopus2015/7550