Near-Field Imaging With Pseudo-Thermal Sources

Abstract

We provide a simple solution for a significant deficiency of near-field microscopy. We demonstrate experimentally that spurious effects caused by interference can be eliminated in passive near-field imaging by implementing a random illumination.

Publication Date

10-25-2017

Publication Title

2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings

Volume

2017-January

Number of Pages

1-2

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/CLEO_QELS.2017.FTh4H.2

Socpus ID

85044184386 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85044184386

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