Near-Field Imaging With Pseudo-Thermal Sources

Abstract

We provide a simple solution for a significant deficiency of near-field microscopy. We demonstrate experimentally that spurious effects caused by interference can be eliminated in passive near-field imaging by implementing a random illumination.

Publication Date

1-1-2017

Publication Title

Optics InfoBase Conference Papers

Volume

Part F42-CLEO_QELS 2017

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/CLEO_QELS.2017.FTh4H.2

Socpus ID

85020659984 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85020659984

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