Time-Resolved Nonlinear Refraction Of Indium Tin Oxide At Epsilon Near Zero

Abstract

Using Beam-Deflection measurements we directly measure the temporal dynamics of nonlinear refraction and transmittance of an ITO thin film in the S -near-zero regime, and find a nonlinear index 5000 times that of glass.

Publication Date

10-25-2017

Publication Title

2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings

Volume

2017-January

Number of Pages

1-2

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/CLEO_QELS.2017.FM2F.2

Socpus ID

85044176235 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85044176235

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