Time-Resolved Nonlinear Refraction Of Indium Tin Oxide At Epsilon Near Zero

Creator

Sepehr Benis, University of Central Florida
Peng Zhao, University of Central Florida
Himansu S. Pattanaik, University of Central Florida
David J. Hagan, University of Central Florida
Eric W. Van Stryland, University of Central Florida

Abstract

Using Beam-Deflection measurements we directly measure the temporal dynamics of nonlinear refraction and transmittance of an ITO thin film in the ε-near-zero regime, and find a nonlinear index 5000 times that of glass.

Publication Date

1-1-2017

Publication Title

Optics InfoBase Conference Papers

Volume

Part F42-CLEO_QELS 2017

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/CLEO_QELS.2017.FM2F.2

Copyright Status

Unknown

Socpus ID

85020637591 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85020637591

STARS Citation

Benis, Sepehr; Zhao, Peng; Pattanaik, Himansu S.; Hagan, David J.; and Van Stryland, Eric W., "Time-Resolved Nonlinear Refraction Of Indium Tin Oxide At Epsilon Near Zero" (2017). Scopus Export 2015-2019. 6830.
https://stars.library.ucf.edu/scopus2015/6830