Calculating The Costs And Benefits Of Metrology: A Case Study

Abstract

In this work, we present a transparent and relatively simple method of calculating the economic viability of a given metrology technique using a case study in crystalline silicon photovoltaic (PV) cell manufacturing. The case study used here is the in-line measurement of implied open-circuit voltage of wafers following the deposition of front and rear side passivation films, which occurs before screen-printing and firing when manufacturing rear passivated PV cells. Cost-benefit calculations are performed using a new freeware tool on the PV Lighthouse website. Here, we show the wafer rejection threshold point selected and the cost of the metrology have a strong influence on the ultimate profitability.

Publication Date

1-1-2017

Publication Title

2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Number of Pages

1-4

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2017.8366822

Socpus ID

85048477801 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85048477801

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