Thermal Failure And Voltage Overshoot Models For Diode Behavior Under Electrostatic Discharge Stresses

Abstract

Diodes are simple but effective solution for Electrostatic Discharge (ESD) protection. In order to evaluate and simulate ESD robustness of diode protection schemes at circuit-level for integrated circuits, models of diode thermal failure and voltage overshoot for ESD simulation are proposed in this paper. These models are based on physical mechanisms of ESD events and device failure. According to simulation results, the models are shown to predict thermal failure and reproduce voltage overshoot phenomena under ESD stresses, respectively.

Publication Date

4-2-2018

Publication Title

2018 18th International Workshop on Junction Technology, IWJT 2018

Volume

2018-January

Number of Pages

1-4

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/IWJT.2018.8330308

Socpus ID

85049729411 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85049729411

This document is currently not available here.

Share

COinS