Investigation Of Phonon-Carrier Interactions In Silicon-Based Mems Resonators

Keywords

acoustoelectric; loss; phonon-carrier; piezoeletric resonator; RF MEMS

Abstract

In this work, a technique is introduced for isolating the energy loss associated with the interaction of charge carriers with acoustic phonons in thin film piezoelectric-on-silicon (TPoS) MEMS resonators. This method facilitates the investigation of acoustoelectric loss mechanism. The variation in quality factor (Q) and insertion loss of high frequency TPoS resonators is reported while the surface carrier concentration of the silicon layer is varied through application of a voltage to the metal-dielectric-silicon capacitor that is intrinsically formed during the conventional fabrication of TPoS resonators. A maximum of 3% improvement in the insertion loss (IL~9 dB) of a ~926 MHz resonance mode is recorded when a 4 V bias is applied to the said capacitance which is believed to stem from a reduction in interaction of acoustic phonons with carriers.

Publication Date

12-31-2018

Publication Title

IFCS 2018 - IEEE International Frequency Control Symposium

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/FCS.2018.8597526

Socpus ID

85061808456 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85061808456

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