Transmission Electron Microscopy Studies Of Transition Metal Oxides Employed As Carrier Selective Contacts In Silicon Solar Cells

Keywords

carrier selective contacts; silicon; transition metal oxide; transmission electron microscopy

Abstract

The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO 2 ) and hole-selective (molybdenum oxide, MoO x ; tungsten oxide, WO x textbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.

Publication Date

11-26-2018

Publication Title

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Number of Pages

2192-2194

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2018.8547689

Socpus ID

85059885905 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85059885905

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