Title
Transmission Electron Microscopy Studies Of Transition Metal Oxides Employed As Carrier Selective Contacts In Silicon Solar Cells
Keywords
carrier selective contacts; silicon; transition metal oxide; transmission electron microscopy
Abstract
The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO 2 ) and hole-selective (molybdenum oxide, MoO x ; tungsten oxide, WO x textbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.
Publication Date
11-26-2018
Publication Title
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
Number of Pages
2192-2194
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/PVSC.2018.8547689
Copyright Status
Unknown
Socpus ID
85059885905 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85059885905
STARS Citation
Ali, Haider; Bullock, James; Gregory, Geoffrey; Yang, Xinbo; and Schneider, Matthew, "Transmission Electron Microscopy Studies Of Transition Metal Oxides Employed As Carrier Selective Contacts In Silicon Solar Cells" (2018). Scopus Export 2015-2019. 9512.
https://stars.library.ucf.edu/scopus2015/9512