Keywords
Photolithography, hybrid photomask, phase grating mask, photoresist, analog micro-optics
Abstract
In the field of photolithography for micro-chip manufacturing, the photo-mask is used to print desired patterns on a proper photo-resist on wafer. The most common type of photo-mask is binary amplitude mask made an opaque layer of chrome. The principle and potential application of hybrid photo-mask with diffractive phase element and binary amplitude is presented in this dissertation paper from both numerical modeling and experimental research. The first important application is the characterization of aberration in the stepper system using hybrid diffractive photo-mask. By utilizing multiple diffractive illumination conditions, it is possible to characterize Zernike wave front aberration coefficients up to any desired order. And, the second application is the use of binary phase grating mask for analog micro-optics fabrication. This approach of using binary phase grating mask for fabricating analog micro-optics turned out to be a very effective alternative for gray-scale mask technology. Since this is a pure phase only mask, it doesn't cause any scattered noise light like half-tone mask and it results in smooth desired resist profile. The benefits and limitations of hybrid diffractive photo-mask approach for both applications are discussed.
Notes
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Graduation Date
2005
Semester
Spring
Advisor
Johnson, Eric
Degree
Doctor of Philosophy (Ph.D.)
College
College of Optics and Photonics
Degree Program
Optics
Format
application/pdf
Identifier
CFE0000350
URL
http://purl.fcla.edu/fcla/etd/CFE0000350
Language
English
Release Date
May 2005
Length of Campus-only Access
None
Access Status
Doctoral Dissertation (Open Access)
STARS Citation
Sung, Jin Won, "A New Hybrid Diffractive Photo-mask Technology" (2005). Electronic Theses and Dissertations. 400.
https://stars.library.ucf.edu/etd/400
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