Abstract
An in-house reflectometer/interferometer has been built to investigate the varying curvature and thickness profiles in the contact line region of air, acetone, iso-octane, ethanol, and water on various types of substrates. Light intensity measurements were obtained using our reflectometer/interferomter and then analyzed in MATLAB to produce thickness and curvature profiles. The apparatus is based on the principle of a reflectometer, consisting of different optical elements, probe, light source, and spectrometer. Our reflectometer/interferomter takes measurements in the UV-Vis-IR range (200nm-1000nm). This range is achieved by using a light source that has both a deuterium light (190nm-800nm), a tungsten halogen light (400nm-1100nm), a Metal-Core Printed Circuit Board LED (800nm-1000nm) and a Metal-Core Printed Circuit board cold white LED (400nm-800nm, 6500 K). A UV-VIS-IR spectrometer reads the light response after light is focused on the region of interest. Then a CCD camera (2448x2048) records the profiles for image analyzing interferometry. The readings were then validated based on results in the literature and studies with cylindrical lens samples.
Notes
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Graduation Date
2017
Semester
Spring
Advisor
Putnam, Shawn
Degree
Master of Science in Aerospace Engineering (M.S.A.E.)
College
College of Engineering and Computer Science
Department
Mechanical and Aerospace Engineering
Degree Program
Aerospace Engineering; Thermofluid Aerodynamic Systems
Format
application/pdf
Identifier
CFE0006559
URL
http://purl.fcla.edu/fcla/etd/CFE0006559
Language
English
Release Date
May 2018
Length of Campus-only Access
1 year
Access Status
Masters Thesis (Open Access)
STARS Citation
Arends-Rodriguez, Armando, "Implementation of Optical Interferometry and Spectral Reflectometry for High Fidelity Thin Film Measurements" (2017). Electronic Theses and Dissertations. 5440.
https://stars.library.ucf.edu/etd/5440