Authors

N. G. Dhere; N. S. Shiradkar;E. Schneller

Comments

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"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in the linked citation and may be found originally at Applied Physics Letters."

Abbreviated Journal Title

Appl. Phys. Lett.

Keywords

Physics, Applied

Abstract

High voltages used in photovoltaic (PV) systems are known to induce long-term power loss in PV modules due to leakage current flowing through the module packaging materials. It has been difficult to identify the specific materials and interfaces responsible for degradation based on an analysis of only the total leakage current. A detailed investigation of the leakage current paths within the PV modules, under high voltage bias, is carried out by utilizing a device that measures the independent contributions of various paths in real-time. Knowledge about dominant leakage current paths can be used to quantify the physical and chemical changes occurring within the module packaging materials.

Journal Title

Applied Physics Letters

Volume

104

Issue/Number

11

Publication Date

1-1-2014

Document Type

Article

Language

English

First Page

4

WOS Identifier

WOS:000333252300029

ISSN

0003-6951

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