Keywords
Integrated circuits -- Very large scale integration
Abstract
VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving.
Notes
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Graduation Date
1984
Semester
Fall
Advisor
Petrasko, Brian E.
Degree
Master of Science (M.S.)
College
College of Engineering
Degree Program
Engineering
Format
Pages
135 p.
Language
English
Rights
Public Domain
Length of Campus-only Access
None
Access Status
Masters Thesis (Open Access)
Identifier
DP0015925
STARS Citation
Didden, William S., "An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group" (1984). Retrospective Theses and Dissertations. 4703.
https://stars.library.ucf.edu/rtd/4703
Contributor (Linked data)
University of Central Florida. College of Engineering [VIAF]
Accessibility Status
Searchable text