Title
A Non-Quasi-Static Small-Signal Model For Metal-Semiconductor Junction Diodes
Abstract
The quasi-static approximation, which assumes that free-carrier propagation delay in the semiconductor device is zero, is often used in device modeling. Consequently, the quasi-static model is adequate only for low-frequency excitations for which free-carrier propagation delay is very small compared to the variation of the excitations. This paper develops a non-quasi-static model suitable for metal-semiconductor junction diodes subjected to small-signal excitation. We show that the predictions of the non-quasi-static model agree more favourably with experimental data taken from AlSi diodes than that of the quasi-static model, particularly when the frequency of the excitation is high. © 1990.
Publication Date
1-1-1990
Publication Title
Solid State Electronics
Volume
33
Issue
12
Number of Pages
1629-1632
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/0038-1101(90)90143-3
Copyright Status
Unknown
Socpus ID
0025628230 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0025628230
STARS Citation
Liou, J. J.; Lee, K.; and Knapp, S. M., "A Non-Quasi-Static Small-Signal Model For Metal-Semiconductor Junction Diodes" (1990). Scopus Export 1990s. 1595.
https://stars.library.ucf.edu/scopus1990/1595