Title
Transient Analysis Of Bipolar Transistors Including Built-In Field And Recombination In Quasi-Neutral Base
Abstract
Transient analysis of bipolar transistors including built-in field and recombination in the base is derived. For the bipolar transistor switching from the salutation to cutoff, minority carriers in the neutral base are mainly removed through the collector terminal, especially for tbe BJT with large base grading. The charge partitioning between the emitter and collector is a strong function of the strength of aiding field and boundary conditions for switching.
Publication Date
1-1-1996
Publication Title
Physica Status Solidi (A) Applied Research
Volume
153
Issue
1
Number of Pages
287-297
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1002/pssa.2211530130
Copyright Status
Unknown
Socpus ID
0029771159 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0029771159
STARS Citation
Yuan, J. S. and Gu, Y., "Transient Analysis Of Bipolar Transistors Including Built-In Field And Recombination In Quasi-Neutral Base" (1996). Scopus Export 1990s. 2353.
https://stars.library.ucf.edu/scopus1990/2353