Title
Array Noise Analysis For Multi-Megabit Dram Design
Abstract
An analytical model for bit-line coupling noise in various DRAM architectures has been developed. The analytical expressions developed provide insight into the charge redistribution when the word lines turn on. They are also useful for determining the noise-to-signal ratio and for designing the sense amplifier circuit. Noise extracted from SPICE circuit simulation is included and is compared against the results from the present analytical model. Good agreement is found. © 1993 Taylor & Francis Ltd.
Publication Date
1-1-1993
Publication Title
International Journal of Electronics
Volume
74
Issue
2
Number of Pages
265-279
Document Type
Article
Identifier
scopus
Personal Identifier
scopus
DOI Link
https://doi.org/10.1080/00207219308925833
Copyright Status
Unknown
Socpus ID
0027541784 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0027541784
STARS Citation
Yuan, J. S. and Liou, J. J., "Array Noise Analysis For Multi-Megabit Dram Design" (1993). Scopus Export 1990s. 771.
https://stars.library.ucf.edu/scopus1990/771