Title

Hot-Carrier And Soft-Breakdown Effects On Vco Performance

Keywords

Circuit reliability; Dielectric breakdown; Hot carriers; MOSFETs; Phase noise; Phase-locked loops; Timing jitter; Voltage-controlled oscillators (VCOs)

Abstract

This paper systematically investigates the hot-carrier- and soft-breakdown-induced performance degradation in a CMOS voltage-controlled oscillator (VCO) used in phase-locked-loop frequency synthesizers. After deriving the closed-form equations to predict phase noise and VCO gain, we relate VCO RF performance such as phase noise, tuning range, and gain of VCO subject to electrical stress. The circuit degradations predicted by analytical model equations are verified by SpectraRF simulation using parameters extracted from the experimental data of 0.16-μm CMOS technology. BERT simulation results give VCO performance degradations versus operation time.

Publication Date

11-1-2002

Publication Title

IEEE Transactions on Microwave Theory and Techniques

Volume

50

Issue

11 SPEC

Number of Pages

2453-2458

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/TMTT.2002.804632

Socpus ID

0036851281 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0036851281

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