Title

Off-Diagonal Mueller Matrix Elements In Backscattering From Highly Diffusive Media

Abstract

Measurements of a reduced Mueller matrix in backscattering from highly diffusive, dielectric samples are reported as a function of the angle of incidence. It was found that the off-diagonal terms depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. We show that, despite a significant scattering originating in the bulk of such diffusive media, the nontrivial behavior of the off-diagonal Muller matrix is primarily due to surface scattering phenomena. The experimental data can be simply explained by assuming a random orientation of small particles and considering only double scattering in the plane of the surface. © 2002 Optical Society of America.

Publication Date

1-1-2002

Publication Title

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volume

19

Issue

1

Number of Pages

43-48

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/JOSAA.19.000043

Socpus ID

0042020117 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0042020117

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