Title

Study Of Organic Thin-Film Transistors Under Electrostatic Discharge Stresses

Keywords

Degradation; electrostatic discharge (ESD); organic thin-film transistor (OTFT)

Abstract

Low-voltage pentacene-based organic thin-film transistors (OTFTs) are characterized for the first time under the electrostatic discharge (ESD) stresses. The measurements are conducted using the transmission line pulsing (TLP) tester which generates the human body model equivalent pulses. The ESD behaviors and tolerances of OTFTs having different dimensions and gate biasing conditions are investigated. OTFT's failure mechanism and dc performance degradation due to the ESD stresses are also studied. © 2011 IEEE.

Publication Date

7-1-2011

Publication Title

IEEE Electron Device Letters

Volume

32

Issue

7

Number of Pages

967-969

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/LED.2011.2142411

Socpus ID

79959795013 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/79959795013

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