Energy-Efficient And Process-Variation-Resilient Write Circuit Schemes For Spin Hall Effect Mram Device
Keywords
Magnetic random access memory (MRAM); magnetic tunnel junction (MTJ); process variation (PV); spin hall effect (SHE) MRAM; spin-based memory cell; write energy
Abstract
In this paper, various energy-efficient write schemes are proposed for switching operation of spin hall effect (SHE)-based magnetic tunnel junctions (MTJs). A transmission gate (TG)-based write scheme is proposed, which provides a symmetric and energy-efficient switching behavior. We have modeled an SHE-MTJ using precise physics equations, and then leveraged the model in SPICE circuit simulator to verify the functionality of our designs. Simulation results show the TG-based write scheme advantages in terms of device count and switching energy. In particular, it can operate at 12% higher clock frequency while realizing at least 13% reduction in energy consumption compared to the most energy-efficient write circuits. We have analyzed the performance of the implemented write circuits in presence of process variation (PV) in the transistors' threshold voltage and SHE-MTJ dimensions. Results show that the proposed TG-based design is the second most PV-resilient write circuit scheme for SHE-MTJs among the implemented designs. Finally, we have proposed the 1TG-1T-1R SHE-based magnetic random access memory (MRAM) bit cell based on the TG-based write circuit. Comparisons with several of the most energy-efficient and variation-resilient SHE-MRAM cells indicate that 1TG-1T-1R delivers reduced energy consumption with 43.9% and 10.7% energy-delay product improvement, while incurring low area overhead.
Publication Date
9-1-2017
Publication Title
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume
25
Issue
9
Number of Pages
2394-2401
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/TVLSI.2017.2699579
Copyright Status
Unknown
Socpus ID
85018883512 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85018883512
STARS Citation
Zand, Ramtin; Roohi, Arman; and DeMara, Ronald F., "Energy-Efficient And Process-Variation-Resilient Write Circuit Schemes For Spin Hall Effect Mram Device" (2017). Scopus Export 2015-2019. 5559.
https://stars.library.ucf.edu/scopus2015/5559